Influence of illumination on dark current in charge-coupled device imagers

Influence of illumination on dark current in charge-coupled device imagers

Thermal excitation of electrons is a major source of noise in charge-coupled-device (CCD) imagers. Those electrons are generated even in the absence of light, hence, the name dark current. Dark current is particularly important for long exposure times and elevated temperatures. The standard procedure to correct for dark current is to take several pictures under the same condition as the real im...

Meyer-Neldel rule for dark current in charge-coupled devices

Active Area Shape Influence on the Dark Current of CMOS Imagers

This work presents an empirical dark current model for CMOS Active Pixel Sensors (APS). The model is based on experimental data taken of a 256x256 APS chip fabricated via HP in a standard 0.5μm CMOS technology process. This quantitative model determines the pixel dark current dependence on two contributing factors: the “ideal” dark current determined by the photodiode junction, introduced here ...

Technology Review of Charge-Coupled Device and CMOS Based Electronic Imagers

– This paper reviewed the technologies that enable Charge-Coupled Device based and CMOS photodiode based image sensors. The advantages and disadvantages of the two types of sensors were presented. It was concluded that in the near future, both types of sensors would continue to play a role in the imaging industry. High image quality applications would continue to demand ChargeCoupled Devices ba...

Bistability in the Electric Current through a Quantum-Dot Capacitively Coupled to a Charge-Qubit

We investigate the electronic transport through a single-level quantum-dot which is capacitively coupled to a charge-qubit. By employing the method of nonequilibrium Green's functions, we calculate the electric current through quantum dot at finite bias voltages. The Green's functions and self-energies of the system are calculated perturbatively and self-consistently to the second order of inte...